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Fault Analysis Using Stft and Travelling Wave Method

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Fault Analysis Using Stft and Travelling Wave Method


Rajesh Saini | Dr. Deepika Chauhan | Mr. Brijraj Singh

https://doi.org/10.31142/ijtsrd11277



Rajesh Saini | Dr. Deepika Chauhan | Mr. Brijraj Singh "Fault Analysis Using Stft and Travelling Wave Method" Published in International Journal of Trend in Scientific Research and Development (ijtsrd), ISSN: 2456-6470, Volume-2 | Issue-3, April 2018, pp.1241-1246, URL: https://www.ijtsrd.com/papers/ijtsrd11277.pdf

Current power supplies must give dependable, fantastic power. In this manner, it is vital that a transmission line blame be recognized precisely, dependably and rectified at the earliest opportunity. A strategy for arranging flaw compose in view of brief time Fourier change (STFT) is given in this paper. STFT is a methods for flag preparing in which a Fourier change (FT) is performed by setting a window work with a consistent size. This change is utilized to break down drifters in the power framework. This paper breaks down qualities of STFT by utilizing reproduction comes about because of MATLAB and characterizes line blames by blame kind. Precise and quick acknowledgment of transmission line blame area is of incredible criticalness to control framework security. Keeping in mind the end goal to settle the T compose transmission line blame area issue, the wave mode change and wavelet change are utilized to get the wavelet modulus maxima, and after that decide line overvoltage wave entry time, finally figure the blame area as per the blame area equation. This paper depicted the guideline of transmission line blame area in light of voyaging waves. The vulnerability of wave speed conveys blunder to blame area in light of voyaging waves. The main heartbeat wave of blame likewise gives numerous trademark data of the disappointment which was utilized to distinguish the sort of disappointments to advantageous the laborers making focused on surge repair.

Short Time Fourier Transform, Transmission Line, EMTP, Fault Detection and Classification


IJTSRD11277
Volume-2 | Issue-3, April 2018
1241-1246
IJTSRD | www.ijtsrd.com | E-ISSN 2456-6470
Copyright © 2019 by author(s) and International Journal of Trend in Scientific Research and Development Journal. This is an Open Access article distributed under the terms of the Creative Commons Attribution License (CC BY 4.0) (http://creativecommons.org/licenses/by/4.0)

International Journal of Trend in Scientific Research and Development - IJTSRD having online ISSN 2456-6470. IJTSRD is a leading Open Access, Peer-Reviewed International Journal which provides rapid publication of your research articles and aims to promote the theory and practice along with knowledge sharing between researchers, developers, engineers, students, and practitioners working in and around the world in many areas like Sciences, Technology, Innovation, Engineering, Agriculture, Management and many more and it is recommended by all Universities, review articles and short communications in all subjects. IJTSRD running an International Journal who are proving quality publication of peer reviewed and refereed international journals from diverse fields that emphasizes new research, development and their applications. IJTSRD provides an online access to exchange your research work, technical notes & surveying results among professionals throughout the world in e-journals. IJTSRD is a fastest growing and dynamic professional organization. The aim of this organization is to provide access not only to world class research resources, but through its professionals aim to bring in a significant transformation in the real of open access journals and online publishing.

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